For independent researchers and user facilities alike, the Park NX10 AFM is an affordable, yet versatile platform that provides ease of use with high-resolution capabilities. The instrument is designed to produce images that are inherently distortion-free and reproducible. The Park NX10’s easy tip exchange combined with SmartScan software’s one-click imaging and pre-programmed advanced modes make Park AFMs stand out. By combining topographical imaging with the material characterization of electrical, magnetic, thermal, and mechanical properties at the nanoscale, the Park NX10 is the premier choice for cutting-edge materials science research.